NTEGRA Spectra Probe NanoLaboratory is equipped with high performance optics that provides scanning of the sample area under the tip with the resolution of 0.4 μm.
Its optical measuring head serves for illuminating the surface with visible light (minimum spot size 0.4 μm) and for collecting the scattered radiation including radiation from immediate vicinity of the tip. Additional capability is confocal Raman microscopy that uses the spectrometer of the instrument.
A large value of the numerical aperture of the objective lens (NA=0.7) allows illuminating the surface at wide angle with high intensity of the normal electric component in the light spot under the probe. This enables measuring tip-enhanced optical effects, including the surface-enhanced Raman scattering.
NTEGRA Spectra PNL provides the following options:
− performing spectral measurements at a certain point and acquiring spectral characteristics of various materials when the instrument operates as a regular spectrometer;
− measuring secondary signal intensity in the selected wavelength range in the mode of layer-specific volumetric scanning of the area 100x100x30 μm;
− acquiring optical images of the object when the instrument operates as a regular laser confocal microscope;
− detecting the object landscape with atomic resolution as well as collecting its electrical, magnetic and nanomechanical properties with force microscopy techniques;
− performing nanoscale measurements of different optical properties relevant to techniques of nonaperturate near-field scanning optical microscopy.
The particular feature of the instrument is its capability to detect optical properties with a number of nonlinear effects, surface-enhanced Raman scattering, and the so-called Tip-Enhanced Raman spectroscopy.
